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Is your feature request related to a problem? Please describe.
Currently a single seed is used throughout the entire benchmarking process.
Also circuits are only generated once for a specific configuration.
This could potentially induce a bias due to the lack of randomness.
Describe the solution you'd like
Introduce a re-seeding between the different evaluations, so that each evaluation runs with a different seed and thus increase the randomness for the circuit generation.
Describe alternatives you've considered
N/A
Additional context
N/A
The text was updated successfully, but these errors were encountered:
Is your feature request related to a problem? Please describe.
Currently a single seed is used throughout the entire benchmarking process.
Also circuits are only generated once for a specific configuration.
This could potentially induce a bias due to the lack of randomness.
Describe the solution you'd like
Introduce a re-seeding between the different evaluations, so that each evaluation runs with a different seed and thus increase the randomness for the circuit generation.
Describe alternatives you've considered
N/A
Additional context
N/A
The text was updated successfully, but these errors were encountered: